Cryo-FIB milled S. cerevisiae lamellas with post-milling platinum sputter coating

Cryo-electron tomography dataset of Saccharomyces cerevisiae cells prepared by cryo-FIB milling with post-milling platinum sputter coating. This dataset is the treatment condition for a study demonstrating that metallic platinum coating of cryo-FIB milled lamellas significantly reduces beam-induced sample movement, enabling sub-5 Angstrom resolution subtomogram averaging of 80S ribosomes in situ. Yeast cells were plunge frozen and automatically FIB-milled, then received additional post-milling platinum sputter coating. Tilt series were collected using a dose-symmetric scheme on a Krios G4 microscope with Selectris X energy filter and Falcon 4 detector at 300 kV.