Cryo-FIB milled S. cerevisiae lamellas without post-milling platinum sputter coating

Cryo-electron tomography dataset of Saccharomyces cerevisiae cells prepared by cryo-FIB milling without post-milling platinum sputter coating. This dataset serves as the control condition for a study demonstrating that metallic platinum coating of cryo-FIB milled lamellas significantly reduces beam-induced sample movement. Yeast cells were plunge frozen and automatically FIB-milled using standard preparation without the additional post-milling platinum sputter coating step. Tilt series were collected using a dose-symmetric scheme on a Krios G4 microscope with Selectris X energy filter and Falcon 4 detector at 300 kV.